TGA 5500

热分析, 熱重分析

The TGA 5500 is designed for the researcher that requires the highest level of performance and features in one package. Built to maximize temperature control and minimize drift, the TGA 5500 has less drift than any competitive TGA – even after they use post-test data manipulation! The TA patented IR furnace delivers the fastest heating and cooling rates available. The all new autosampler makes high productivity standard.

TGA 550

热分析, 熱重分析

The TGA 550 will not only outperform competitive top tier systems, but will also give users the flexibility to add advanced features like Hi-Res TGA, MTGA, DTA signal, and our new 25-position autosampler. The performance, flexibility, and ease-of-use, make this an excellent TGA for research and multi-user laboratories where a wide variety of TGA experiments are conducted, and where future expansion of analytical work is anticipated.

TGA 55

热分析, 熱重分析

The TGA 55 is specifically designed for those that want rugged, reliable, and cost-effective TGA, and are not willing to accept poor data. Utilizing TA’s proprietary Tru-Mass™ Balance as the core of the system, the TGA 55 will outperform competitive research-grade models. Its sensitivity, accuracy and ease-of-use make this TGA an ideal instrument for basic research, teaching or industrial labs that need quality results.

DLF 1600

閃光擴散率系統, 雷射閃光

Discovery Laser Flash DLF 1600’s source module is a freestanding unit employing a custom Class 1 35 J Nd:Glass laser pulse source. It provides a collimated, monochromatic energy pulse to specimens heated up to the temperature of 1600°C. The laser radiation is delivered via a proprietary fiber optic delivery wand which ensures a 99% homogenized laser pulse. Leading to much more accurate measurements than any direct firing laser pulse instruments. The laser source produces a 300 µs to 400 µs pulse width.

多試樣疲勞

Multi-Specimen Fatigue, 心血管儀器, 材料表徵

為了以更低成本更快繪製NiTi、CoCr以及SS支架材料和結構的疲勞壽命(s/n)曲線，TA ElectroForce利用ElectroForce® 3200和3330測試儀器的通用性設定了多試樣測試系統。這兩種系統均擁有TA ElectroForce高精度位移感應器的增強測量功能。通過改進低振幅位移測量，這可擴大測試範圍，所有這一切都是通過易於使用的單個位移通道實現的。感應器經校準後可達到最高精度等級，即ASTM E-2309 A類標準

DLF 1200

產品, 閃光擴散率系統, 雷射閃光

The Discovery Laser Flash DLF 1200 employs a custom Class 1 Nd:Glass Laser pulse source to provide a collimated, monochromatic energy pulse with a 300 μs to 400 μs pulse width. Ideal for labs that need to measure thermal diffusivity, heat capacity or thermal conductivity at temperatures up to 1200°C, or require the power of a laser in a compact benchtop instrument.

Equipped with a liquid nitrogen-cooled IR detector, DLF 1200 provides high precision, quick response, non-contact measurements in air, inert gas or vacuum to 10-3 torr. Simple to operate and safe to use, easy to maintain and very economical to operate, these systems are suitable for research and development programs, as well as quality control.

DXF 900

氙氣閃光燈, 產品, 閃光擴散率系統

The Discovery Xenon Flash (DXF) source module employs a High Speed Xenon-pulse Delivery source (HSXD) which has considerably higher efficiency, lower costs and less maintenance than equivalent systems. A reflective optic configuration of our design effectively harnesses the power of a Xenon flash tube and, with the aid of proprietary wave guides, delivers it to the specimen inside the Environmental Module. DXF 900 produces a pulse width of 400 μs to 600 μs and uniformly concentrates the power from the flash source directly on the entire face of the specimen. Due to this optimized optical arrangement and the broad light spectrum, specimens as large as 25 mm in diameter can be illuminated with sufficient energy to make a high-accuracy measurement. The use of large samples diminishes errors associated with inhomogeneity and permits representative measurements of poorly dispersed composites.

DXF 500

氙氣閃光燈, 產品, 閃光擴散率系統

The Discovery Xenon Flash (DXF) source module employs a High Speed Xenon-pulse Delivery source (HSXD) which has considerably higher efficiency, lower costs and less maintenance than equivalent systems. A reflective optic configuration of our design effectively harnesses the power of a Xenon flash tube and, with the aid of proprietary wave guides, delivers it to the specimen inside the Environmental Module. DXF 500 produces a pulse width of 400 μs to 600 μs and uniformly concentrates the power from the flash source directly on the entire face of the specimen. Due to this optimized optical arrangement and the broad light spectrum, specimens as large as 25 mm in diameter can be illuminated with sufficient energy to make a high-accuracy measurement. The use of large samples diminishes errors associated with inhomogeneity and permits representative measurements of poorly dispersed composites.