DIL 820系列立式熱膨脹儀
DIL 820系列儀器在工作時保持垂直方向,這使其能夠以獨特方式進行設定,以便分析燒結,在速率控制燒結(RCS)模式下進行研究,以及測定樣品的膨脹參數,而在採用臥式設計的傳統熱膨脹儀上難以分析這些參數。
提供了兩種不同型號(DIL 821和DIL 822),這兩個設備均採用具有1nm解析度的新光學編碼器。在搭配使用DIL822的獨特真實差分測量技術時,可獲得市場上最佳的測量敏感度和CTE準確度。
DIL 820系列儀器在工作時保持垂直方向,這使其能夠以獨特方式進行設定,以便分析燒結,在速率控制燒結(RCS)模式下進行研究,以及測定樣品的膨脹參數,而在採用臥式設計的傳統熱膨脹儀上難以分析這些參數。
提供了兩種不同型號(DIL 821和DIL 822),這兩個設備均採用具有1nm解析度的新光學編碼器。在搭配使用DIL822的獨特真實差分測量技術時,可獲得市場上最佳的測量敏感度和CTE準確度。
HP TGA 75/750 全球首款台式高壓 TGA,採用獲得專利的頂端裝載磁懸浮天平 <…
DIL 831 高解析度臥式推桿熱膨脹儀 目前效能最出色的單樣品推桿熱膨脹儀中的高敏感度光學編碼器和機動化爐膛…
DIL 832 高解析度True Differential™臥式推桿熱膨脹儀 高敏感度光學編碼器和TA獨家真實…
Discovery DSC 25P 高壓力差示掃描熱量計 DSC 25P – 滿足您對於壓力 DSC 的需求.…
Discovery Laser Flash DLF 1600’s source module is a freestanding unit employing a custom Class 1 35 J Nd:Glass laser pulse source. It provides a collimated, monochromatic energy pulse to specimens heated up to the temperature of 1600°C. The laser radiation is delivered via a proprietary fiber optic delivery wand which ensures a 99% homogenized laser pulse. Leading to much more accurate measurements than any direct firing laser pulse instruments. The laser source produces a 300 µs to 400 µs pulse width.
為了以更低成本更快繪製NiTi、CoCr以及SS支架材料和結構的疲勞壽命(s/n)曲線,TA ElectroForce利用ElectroForce® 3200和3330測試儀器的通用性設定了多試樣測試系統。這兩種系統均擁有TA ElectroForce高精度位移感應器的增強測量功能。通過改進低振幅位移測量,這可擴大測試範圍,所有這一切都是通過易於使用的單個位移通道實現的。感應器經校準後可達到最高精度等級,即ASTM E-2309 A類標準
DMA 3200 高力度 DMA DMA 3200 結合數十年的尖端疲勞技術與領先世界的動態機械分析技術,成為…
The Discovery Laser Flash DLF 1200 employs a custom Class 1 Nd:Glass Laser pulse source to provide a collimated, monochromatic energy pulse with a 300 μs to 400 μs pulse width. Ideal for labs that need to measure thermal diffusivity, heat capacity or thermal conductivity at temperatures up to 1200°C, or require the power of a laser in a compact benchtop instrument.
Equipped with a liquid nitrogen-cooled IR detector, DLF 1200 provides high precision, quick response, non-contact measurements in air, inert gas or vacuum to 10-3 torr. Simple to operate and safe to use, easy to maintain and very economical to operate, these systems are suitable for research and development programs, as well as quality control.
The Discovery Xenon Flash (DXF) source module employs a High Speed Xenon-pulse Delivery source (HSXD) which has considerably higher efficiency, lower costs and less maintenance than equivalent systems. A reflective optic configuration of our design effectively harnesses the power of a Xenon flash tube and, with the aid of proprietary wave guides, delivers it to the specimen inside the Environmental Module. DXF 900 produces a pulse width of 400 μs to 600 μs and uniformly concentrates the power from the flash source directly on the entire face of the specimen. Due to this optimized optical arrangement and the broad light spectrum, specimens as large as 25 mm in diameter can be illuminated with sufficient energy to make a high-accuracy measurement. The use of large samples diminishes errors associated with inhomogeneity and permits representative measurements of poorly dispersed composites.
The Discovery Xenon Flash (DXF) source module employs a High Speed Xenon-pulse Delivery source (HSXD) which has considerably higher efficiency, lower costs and less maintenance than equivalent systems. A reflective optic configuration of our design effectively harnesses the power of a Xenon flash tube and, with the aid of proprietary wave guides, delivers it to the specimen inside the Environmental Module. DXF 500 produces a pulse width of 400 μs to 600 μs and uniformly concentrates the power from the flash source directly on the entire face of the specimen. Due to this optimized optical arrangement and the broad light spectrum, specimens as large as 25 mm in diameter can be illuminated with sufficient energy to make a high-accuracy measurement. The use of large samples diminishes errors associated with inhomogeneity and permits representative measurements of poorly dispersed composites.