DIL 820系列立式熱膨脹儀

DIL 820系列儀器在工作時保持垂直方向,這使其能夠以獨特方式進行設定,以便分析燒結,在速率控制燒結(RCS)模式下進行研究,以及測定樣品的膨脹參數,而在採用臥式設計的傳統熱膨脹儀上難以分析這些參數。

提供了兩種不同型號(DIL 821和DIL 822),這兩個設備均採用具有1nm解析度的新光學編碼器。在搭配使用DIL822的獨特真實差分測量技術時,可獲得市場上最佳的測量敏感度和CTE準確度。

DLF 1600

Discovery Laser Flash DLF 1600’s source module is a freestanding unit employing a custom Class 1 35 J Nd:Glass laser pulse source. It provides a collimated, monochromatic energy pulse to specimens heated up to the temperature of 1600°C. The laser radiation is delivered via a proprietary fiber optic delivery wand which ensures a 99% homogenized laser pulse. Leading to much more accurate measurements than any direct firing laser pulse instruments. The laser source produces a 300 µs to 400 µs pulse width.

多試樣疲勞

為了以更低成本更快繪製NiTi、CoCr以及SS支架材料和結構的疲勞壽命(s/n)曲線,TA ElectroForce利用ElectroForce® 3200和3330測試儀器的通用性設定了多試樣測試系統。這兩種系統均擁有TA ElectroForce高精度位移感應器的增強測量功能。通過改進低振幅位移測量,這可擴大測試範圍,所有這一切都是通過易於使用的單個位移通道實現的。感應器經校準後可達到最高精度等級,即ASTM E-2309 A類標準

DLF 1200

The Discovery Laser Flash DLF 1200 employs a custom Class 1 Nd:Glass Laser pulse source to provide a collimated, monochromatic energy pulse with a 300 μs to 400 μs pulse width. Ideal for labs that need to measure thermal diffusivity, heat capacity or thermal conductivity at temperatures up to 1200°C, or require the power of a laser in a compact benchtop instrument.

Equipped with a liquid nitrogen-cooled IR detector, DLF 1200 provides high precision, quick response, non-contact measurements in air, inert gas or vacuum to 10-3 torr. Simple to operate and safe to use, easy to maintain and very economical to operate, these systems are suitable for research and development programs, as well as quality control.

DXF 900

The Discovery Xenon Flash (DXF) source module employs a High Speed Xenon-pulse Delivery source (HSXD) which has considerably higher efficiency, lower costs and less maintenance than equivalent systems. A reflective optic configuration of our design effectively harnesses the power of a Xenon flash tube and, with the aid of proprietary wave guides, delivers it to the specimen inside the Environmental Module. DXF 900 produces a pulse width of 400 μs to 600 μs and uniformly concentrates the power from the flash source directly on the entire face of the specimen. Due to this optimized optical arrangement and the broad light spectrum, specimens as large as 25 mm in diameter can be illuminated with sufficient energy to make a high-accuracy measurement. The use of large samples diminishes errors associated with inhomogeneity and permits representative measurements of poorly dispersed composites.

DXF 500

The Discovery Xenon Flash (DXF) source module employs a High Speed Xenon-pulse Delivery source (HSXD) which has considerably higher efficiency, lower costs and less maintenance than equivalent systems. A reflective optic configuration of our design effectively harnesses the power of a Xenon flash tube and, with the aid of proprietary wave guides, delivers it to the specimen inside the Environmental Module. DXF 500 produces a pulse width of 400 μs to 600 μs and uniformly concentrates the power from the flash source directly on the entire face of the specimen. Due to this optimized optical arrangement and the broad light spectrum, specimens as large as 25 mm in diameter can be illuminated with sufficient energy to make a high-accuracy measurement. The use of large samples diminishes errors associated with inhomogeneity and permits representative measurements of poorly dispersed composites.